Microscopy, Scanning Probe

Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING).

Year introduced: 2000

PubMed search builder options

Subheadings:

Restrict to MeSH Major Topic.

Do not include MeSH terms found below this term in the MeSH hierarchy.

Tree Number(s): E01.370.350.515.666, E05.595.666

MeSH Unique ID: D020527

Entry Terms:

• Scanning Probe Microscopy

Previous Indexing:

• Microscopy, Atomic Force (1999)

All MeSH Categories
Analytical, Diagnostic and Therapeutic Techniques and Equipment Category
Diagnosis
Diagnostic Techniques and Procedures
Diagnostic Imaging
Microscopy
Microscopy, Scanning Probe
Microscopy, Atomic Force
Microscopy, Electrochemical, Scanning
Microscopy, Scanning Tunneling

All MeSH Categories
Analytical, Diagnostic and Therapeutic Techniques and Equipment Category
Investigative Techniques
Microscopy
Microscopy, Scanning Probe
Microscopy, Atomic Force
Microscopy, Electrochemical, Scanning
Microscopy, Scanning Tunneling