Electron Probe Microanalysis
Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.
Year introduced: 1970(1967)
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Tree Number(s): E01.370.350.515.402.250, E05.196.867.800.360, E05.595.402.250, E05.799.830.360
MeSH Unique ID: D004577
Entry Terms:
- Electron Probe Microanalyses
- Microanalyses, Electron Probe
- Probe Microanalyses, Electron
- Probe Microanalysis, Electron
- Spectrometry, X Ray Emission, Electron Microscopic
- Microanalysis, Electron Probe
- Spectrometry, X Ray Emission, Electron Probe
- Spectrometry, X-Ray Emission, Electron Microscopic
- Spectrometry, X-Ray Emission, Electron Probe
- X Ray Emission Spectrometry, Electron Microscopic
- X Ray Emission Spectrometry, Electron Probe
- X-Ray Emission Spectrometry, Electron Microscopic
- X-Ray Emission Spectrometry, Electron Probe
- X-Ray Microanalysis
- Microanalysis, X-Ray
- X Ray Microanalysis
- X-Ray Microanalysis, Electron Microscopic
- X Ray Microanalysis, Electron Microscopic
- Microscopy, Electron, X-Ray Microanalysis
- X-Ray Microanalysis, Electron Probe
- X Ray Microanalysis, Electron Probe
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